Seminars & Workshops

Presentations         Tuesday – Thursday      11 a.m. – 12 p.m.


Tuesday 11:00 a.m. The Anton Paar Litesizer 500 – Particle Size Measurement and so much more (Zeta-potential, Molecular Weight, Refractive Index…)


Tuesday 11:30 a.m. The Anton Paar HIT 300 NanoIndenter – Hardness measurement for thin films and the world of Nano-Engineering


Wednesday 11 a.m.   Non-ambient x-ray diffraction – How to use the vacuum chamber, TTK 600, the sample holder for air-sensitive powders and the capillary spinner for samples in capillaries


Thursday 11 a.m.    Small-angle x-ray scattering (SAXS) – How to make your SAXS measurements and how to interpret them (Measurement and Data analysis techniques)


Workshops             Tuesday – Thursday      1 p.m. – 5 p.m.

     Please sign up at 


DLS and other applications of the Litesizer 500:

Light scattering measurements are operationally simple methods to gain crucial insight on colloidal suspensions. Dynamic light scattering (DLS) and electrophoretic light scattering (ELS) are techniques that provide particle size distribution and Zeta potential values, respectively. Particle size and particle size distribution (down to 0.3 nm) is an important parameter to establish aggregation, sedimentation, homogeneity of a colloidal suspension. Zeta potential is important for controlling interfacial chemistry and stability of dispersions. It can be used to estimate the success of surface functionalization and colloidal stability, update by cellular membranes. Applications include Proteins, Vaccine, Injectables, Polymers, Plastics, Silica, Metals, Minerals, Food, Cosmetics, Inks, Electronics, Chemical mechanical polishing The Anton Paar Litesizer 500 provides both techniques in one instrument, and can also be used to measure molecular weight, transmittance and refractive index.


Nano-Indentation / HIT 300: 

Conventional methods for hardness testing quickly reach their limits when it comes to mechanical characterization of thin films and measurements on the nanoscale. During this seminar Dr. Sai Krishna Katla will discuss new technologies, such as the Instrumented Indentation Testing (ITT) technique enabling accurate and affordable hardness measurements of thin coatings and will provide a live-demonstration of Anton Paar’s next-generation benchtop nanoindenter, the Hit 300 Instrument.


XRD & non-ambient XRD: 

X-ray diffraction is a non-destructive method to investigate material properties such as qualitative composition, quantitative composition, strain/stress, crystal size, lattice parameters, etc. Non-ambient measurements involve control of ambient conditions such as temperature, pressure, gas environment, relative humidity, etc.  This seminar and hands on workshop will utilize Anton Paar’s XRDynamic 500 and sample stages such as capillary spinner, TTK 600 and EVAC module that are housed in the NanoEngineering Materials Research Center (NE-MRC).


Small Angle X-ray Scattering (SAXS):

SAXS is an accurate, non-destructive characterization method usually requiring only minimal sample preparation. It is broadly applicable to numerous research areas such as biological materials, polymers, nanocomposites and pharma, this method can be used for solid or liquid samples which can contain solid, liquid or gaseous domains.


This seminar will cover:


- X-ray and SAXS basics/theory

- SAXS vs microscopy vs XRD

- Primary data handling

- Data interpretation

- Complementary and combined methods

- Application examples

Speaker Bios:

Dr. Vidumin Dahanayake (DLS)

Vidumin Dahanayake is a technical sales consultant with the Anton Paar USA Western Region team. He holds a Ph.D in chemistry from Georgetown University, where his focus was mini-emulsion synthesis and pharmacokinetic evaluation of metal oxo cluster-embedded nano beads and has over 15 years of material characterization experience. Vidumin has worked very closely with industrial and academic partners on various materials exploring particle size, porosity, density, surface area and solid surface Zeta potential.

Dr. Sai Krishna Katla (Nanoindentation)

Sai Krishna Katla joined Anton Paar USA in 2022 and is currently an Advanced Application Scientist for its Western Region. His product specialization is in particles and surface materials characterization and is constantly engaged in solving customers’ problems with sample measurement, analysis and method development. Prior to joining Anton Paar, Sai was a Research Associate at Harvard University with research focused on polymeric nanoparticles and their applications in chemical artificial life. He earned his Ph.D. in Materials Science from JNCASR, India.



Dr. Semih Gulec (non-ambient XRD & SAXS)

Semih Gulec obtained his Masters and PhD in Chemical Engineering from Lamar University (TX, USA). His research areas include solid-liquid adhesion, surfactants, tribology, surface chemistry, material science and analytical equipment development. He joined Anton Paar in 2020 to support Atomic Force Microscopy, tribometers, indentation and scratch instruments. He now supports the X-ray Structural Analysis; Small Angle X-ray Scattering (SAXS), X-ray Diffraction (XRD) and non-ambient XRD activities such as technical guidance, method development, installation and training.