Anton Paar XRDynamic 500

Thermal Stability of Organic Semiconductor Monolayers Monitored by In-situ X-ray Reflectivity

Nanoscale Phase Evolution in Lithium-Air Batteries as revealed by In-situ Small Angle X-ray Scattering

Sintering Behavior of Thiol-Capped Gold Nanoparticles Investigated with the TTK 600

Monitoring the Formation of CuO Nanowires Using In-situ High Temperature X-ray Diffraction

Non-ambient XRD Investigation of a Hydrophobic Framework Material for Trace CO2 Capture

Structural Characterization of a Mesoporous Material

• non-ambient atmospheres / low temperature chamber

• vacuum chamber with signal to noise improvement

• x,y-stage with12 samples spinner, x-y resolved measurements

• Measurement at elevated temperatures

• Air, vacuum or inert atmospheres

• SAXS on thin films & suspensions

• Transmission measurements

• Grazing incidence / XRR measurements