Over 3000 indexed patterns per second (pps)
Up to 30x faster than existing CCD-based detectors
Extreme sensitivity for low current and low kV analyses
1244 x 1024 pixel resolution, ideal for HR-EBSD applications
High resolution patterns at all speeds
Innovative design features for simple operation
The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials.
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